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Radiobiological risk and single event effects during manned space flights
1CERT-ONERA/DERTS, Toulouse, France.
Acta Astronautica
|October 1, 1995
Summary
Future space missions face significant radiation risks, unlike past flights. These hazards, particularly Single Event Effects on electronics, threaten mission reliability and crew safety, necessitating new protective measures.
Area of Science:
- Space exploration
- Radiation physics
- Electronics reliability
Background:
- Past space missions (MIR, SHUTTLE) experienced manageable radiation levels.
- Future missions to Mars, Moon, and high-Earth orbits pose increased radiation exposure.
- VLSI devices are vulnerable to Single Event Effects from space radiation.
Purpose of the Study:
- To analyze radiation hazards for future space missions.
- To assess the risk of Single Event Effects on VLSI devices.
- To propose countermeasures against space radiation risks.
Main Methods:
- Review of radiation monitoring data from previous manned space flights.
- Analysis of radiobiological risks associated with deep space and high-orbit missions.
- Identification of Single Event Effects on Very Large Scale Integration (VLSI) devices.
Main Results:
- Radiation exposure was not critical in past missions like MIR and SHUTTLE.
- Future missions face substantial radiobiological risks.
- Single Event Effects on VLSI devices can cause critical reliability losses.
Conclusions:
- Space radiation poses a significant threat to future manned missions.
- VLSI device reliability is a key concern due to Single Event Effects.
- Proactive countermeasures are essential for mission success and crew safety.