C Jacobsen1, S Wirick, G Flynn
1Department of Physics and Astronomy, State University of New York at Stony Brook 11794-3800, USA. jacobsen@xray1.physics.sunysb.edu
This study introduces a new X-ray microscopy method to analyze material composition at the nanoscale. The technique enables detailed chemical mapping of diverse samples, including polymers and extraterrestrial dust.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: