Updated: Jun 24, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
1Department of Physics, Brown University, Providence, Rhode Island 02912, USA. pertsin@barus.physics.brown.edu
Lattice Centering and Coordination Number
P-N junction
Unit Cells
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
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