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Secondary ion mass spectrometric investigation of Au-based composites
S Barison1, C Piccirillo, M Fabrizio
1IPELP-CNR, Corso Stati Uniti 4, 35127 Padua, Italy.
Rapid Communications in Mass Spectrometry : RCM
|October 25, 2001
Abstract:
The electrodeposition of thick gold layers plays an important role both in traditional and high-tech productions, such as jewelry and microelectronics, respectively. In this work a secondary ion mass spectrometric study will be presented on Au co-deposits with (sub-)micrometric ceramic powders, in order to harden gold. Mass spectra are used to identify the components deposited, providing evidence of the additives and/or eventual contaminants introduced during electrolysis. Furthermore, analysis of ion depth profiles and the intensity distribution of ionic species along the film were studied.