Related Experiment Video
Updated: Aug 17, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Luminescence from metallic quantum wells in a scanning tunneling microscope
G Hoffmann1, J Kliewer, R Berndt
1Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel, D-24098 Kiel, Germany. hoffmann@physik.uni-kiel.de
Abstract:
The tunneling current of a scanning tunneling microscope is reported to cause light emission from the metallic quantum well system Na on Cu(111). Optical spectra along with tunneling spectroscopy show that one component of the emission is due to interband transitions between quantum well states of the Na layer. The other component is similar to plasmon-mediated emission observed previously from noble metals. The emission is a unique local probe of the electronic structure of this quantum well system.
More Related Videos
12:57Resonance Fluorescence of an InGaAs Quantum Dot in a Planar Cavity Using Orthogonal Excitation and Detection
Published on: October 13, 2017
11:33All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Photoluminescence: Fluorescence and Phosphorescence
A pair of electrons in a...
Photoluminescence: Applications