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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
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Sub-Angstrom high-resolution transmission electron microscopy at 300 keV

M A O'Keefe1, C J Hetherington, Y C Wang

  • 1Materials Science Division, National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA. maok@lbl.gov

Ultramicroscopy
|January 5, 2002
PubMed

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