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Field-induced electron emission from electrically nanostructured heterogeneous (ENH) materials
1School of Electronic Engineering, University of Surrey, Guildford, UK. r.forbes@surrey.ac.uk
Ultramicroscopy
|January 5, 2002
Summary
Electrically nanostructured heterogeneous materials enable low macroscopic field electron emission due to internal field enhancement. This facilitates rapid electron escape into vacuum via tunneling.
Area of Science:
- Materials Science
- Physics
- Nanotechnology
Background:
- Electrically nanostructured heterogeneous (ENH) materials are thin films on conducting substrates.
- These materials exhibit low macroscopic field (LMF) electron emission when electric fields are applied.
Purpose of the Study:
- To discuss the origins of field-induced electron emission from ENH materials.
- To provide an updated summary of the theory explaining LMF emission.
Main Methods:
- Theoretical analysis of ENH material structure and properties.
- Explanation of internal field enhancement mechanisms within the nanostructure.
Main Results:
- ENH materials create internal field enhancement, leading to high local fields at the vacuum interface.
- This high local field enables rapid electron escape into vacuum through quantum mechanical tunneling.
Conclusions:
- The electrical nanostructure within ENH films is crucial for achieving LMF electron emission.
- The theory explains how internal field enhancement facilitates electron emission from these materials.