P M Hoffmann1, S Jeffery, J B Pethica
1Department of Physics, Wayne State University, 666 W. Hancock, Detroit, Michigan 48201, USA. hoffmann@physics.wayne.edu
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Atomic scale dissipation was measured using an atomic force microscope. Dissipation in the noncontact regime is linked to atomic defects, while contact regime dissipation shows plasticity differences between silicon and copper surfaces.
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