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Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates

Tamotsu Ohno1, Masaya Sengoku, Tatsuo Arii

  • 1Department of Physics, Aichi Medical University, Nagakute-cho, Aichi-ken, Japan. ohno@aichi-med-u.ac.jp

Micron (Oxford, England : 1993)
|January 30, 2002
PubMed

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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