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Updated: Oct 2, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Influence of metal roughness on the near-field generated by an aperture/apertureless probe

O J F Martin1, M Paulus

  • 1Electromagnetic Fields and Microwave Electronics Laboratory, Swiss Federal Institute of Technology, ETH-Zentrum ETZ, CH-8092 Zurich, Switzerland. martin@ifh.ee.ethz.ch

Journal of Microscopy
|March 7, 2002
PubMed

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