Stéphane Roux1, François Hild, Yves Berthaud
1Laboratoire Surface du Verre et Interfaces, Unité Mixte de Recherche 125, Centre National de la Recherche Scientifique/Saint-Gobain, Aubervilliers, France. Stephane.Roux@saint-gobain.com
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A novel method analyzes image deformation to precisely measure displacement fields, offering spectral decomposition unlike standard techniques. This approach enhances accuracy in analyzing material stress and deformation, particularly for one-dimensional signals.
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