Imaging the three orientation variants of the DO22 phase by 3D atom probe microscopy

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Updated: Oct 2, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

L Marteau1, C Pareige, D Blavette

  • 1Groupe de Physique des Matériaux UMR 6634 - UFR Sciences, Université de Rouen 76 821 Mont Saint Aignan Cedex, France.

Journal of Microscopy
|March 21, 2002
PubMed

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