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Development of microwave-assisted drying methods for sample preparation for dried spot micro-X-ray fluorescence
Dirk D Link1, H M Kingston, George J Havrilla
1Department of Energy, National Energy Technology Laboratory, Pittsburgh, Pennsylvania 15236-0940, USA.
Analytical Chemistry
|April 2, 2002
Summary
Microwave-assisted drying improves trace elemental analysis sample preparation. This method offers faster, more controlled drying for dried spot micro X-ray fluorescence (MXRF) analysis, minimizing analyte loss.
Area of Science:
- Analytical Chemistry
- Materials Science
Background:
- Dried spot micro X-ray fluorescence (MXRF) is vital for trace elemental analysis.
- Current sample preparation methods for MXRF have limitations, including long drying times, environmental control issues, and volatile analyte loss.
Purpose of the Study:
- To evaluate microwave-assisted drying as an improved technique for preparing dried spots for trace analysis.
- To develop and test apparatus designs for microwave drying in sample preparation.
Main Methods:
- Two microwave drying apparatus designs were constructed and tested.
- Aqueous samples, including multielement standards, a reference material, and a semiconductor cleaning solution, were dried using microwave assistance.
- Residues were redissolved and analyzed by Inductively Coupled Plasma Mass Spectrometry (ICP-MS).
Main Results:
- Microwave-assisted drying demonstrated effective recovery of analytes.
- The technique provided better control over the sample preparation environment.
- Minimized loss of volatile analytes was observed compared to conventional drying.
Conclusions:
- Microwave-assisted drying is an efficient alternative for preparing dried spots for trace elemental analysis.
- The developed apparatus and methods offer advantages in speed and control over traditional sample preparation techniques.
- This approach enhances the reliability and efficiency of MXRF analysis.