B K Ngoi1, K Venkatakrishnan, N R Sivakumar
1PEN Centre, School of Mechanical and Production Engineering, Nanyang Technological University, Singapore. mbngoi@ntu.edu.sg
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This study introduces a modified phase-shifting interferometry technique for precise microsurface profiling of vibrating flat surfaces. The novel method ensures accurate measurements by eliminating motion-related errors and demonstrating immunity to vibrations.
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