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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Numerical statistics of power dropouts based on the Lang-Kobayashi model

J Mulet1, C R Mirasso

  • 1Instituto Mediterráneo de Estudios Avanzados, (CSIC-UIB), E-07071 Palma de Mallorca, Spain.

Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
|April 24, 2002
PubMed

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