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Updated: Aug 19, 2026

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
14:11

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Published on: March 29, 2016

Quantitative depth profiling of argon in tungsten films by secondary ion mass spectrometry

H Yamazaki1

  • 1Toshiba Corporation, Research and Development Center, Isogo, Yokohama, Japan.

Analytical Sciences : the International Journal of the Japan Society for Analytical Chemistry
|May 7, 2002
PubMed

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