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Related Experiment Videos

Extracting twins from orientation imaging microscopy scan data.

S I Wright1, R J Larsen

  • 1TexSEM Laboratories/EDAX, Draper, UT 84020, USA. swright@tsl-oim.com

Journal of Microscopy
|May 9, 2002
PubMed
Summary
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Automated electron backscatter diffraction (OIM) can now identify twin boundaries and improve grain size analysis. This method confirms twinning planes remain coherent during zirconium deformation.

Area of Science:

  • Materials Science
  • Crystallography
  • Microscopy

Background:

  • Automated electron backscatter diffraction (EBSD), also known as orientation imaging microscopy (OIM), provides crystallographic orientation measurements on regular grids.
  • Identifying twin boundaries typically involves analyzing misorientation between neighboring measurements and checking for coincidence with twinning planes and grain boundary planes.

Purpose of the Study:

  • To develop an automated methodology for extracting twin boundary data from OIM scans.
  • To assess the coherence of twinning planes during material deformation.
  • To enhance the accuracy of OIM-derived grain size distributions.

Main Methods:

  • Utilizing OIM data to measure misorientation between adjacent points on a grid.
  • Implementing an automated approach to identify potential twin boundaries based on misorientation criteria and twinning plane/grain boundary coincidence.

Related Experiment Videos

  • Applying the developed methodology to deformed zirconium samples.

    • Main Results:

    • The automated OIM methodology successfully identified potential twin boundaries.
    • Analysis of deformed zirconium indicated that twinning planes remain coherent during deformation.
    • The methodology improved OIM-based grain size distributions, aligning them more closely with conventional metallography results.

    Conclusions:

    • An automated OIM approach can effectively identify twin boundaries and assess twinning plane coherence.
    • The developed method refines OIM's capability for accurate grain size distribution analysis.
    • This technique offers a more comprehensive understanding of crystallographic features in deformed materials.