Adaptive correction of depth-induced aberrations in multiphoton scanning microscopy using a deformable mirror

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Bringing the Visible Universe into Focus with Robo-AO
10:35

Bringing the Visible Universe into Focus with Robo-AO

Published on: February 12, 2013

L Sherman1, J Y Ye, O Albert

  • 1Center for Ultrafast Optical Science, 1006 IST Bldg, University of Michigan, 2200 Bonisteel Blvd, Ann Arbor, MI 48109, USA.

Journal of Microscopy
|May 10, 2002
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The probe is regarded as the heart of any AFM setup and comprises the...