Overview of Electron Microscopy
Scanning Electron Microscopy
Preparation of Samples for Electron Microscopy
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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
M Aronsson1, O Savborg, G Borgefors
1Centre for Image Analysis, Lägerhyddvägen 17, 752 37 Uppsala, Sweden. mattiasa@cb.uu.se
A novel non-linear filter enhances digital images by using distance transforms to correct uneven scanning electron microscope backgrounds. This fast filtering method reduces blurring and homogenizes background pixels in fibre images.
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