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Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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Minimizing scanning electron microscope artefacts by filter design.

M Aronsson1, O Savborg, G Borgefors

  • 1Centre for Image Analysis, Lägerhyddvägen 17, 752 37 Uppsala, Sweden. mattiasa@cb.uu.se

Journal of Microscopy
|May 10, 2002
PubMed
Summary
This summary is machine-generated.

A novel non-linear filter enhances digital images by using distance transforms to correct uneven scanning electron microscope backgrounds. This fast filtering method reduces blurring and homogenizes background pixels in fibre images.

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Area of Science:

  • Digital Image Processing
  • Microscopy Image Analysis

Background:

  • Scanning electron microscopy (SEM) often produces images with uneven background responses.
  • Traditional filtering methods like convolution can introduce blurring effects.
  • Accurate background correction is crucial for quantitative analysis of microscopic images.

Purpose of the Study:

  • To develop a new non-linear filter for digital images.
  • To attenuate uneven background responses in SEM images.
  • To reduce blurring and improve homogeneity of background pixels.

Main Methods:

  • Utilized distance transforms to estimate the average point spread function (PSF) of fibre cross-sectional images.
  • Developed a fast filter technique employing lookup tables for distance layers.
  • Applied a pixel-wise classifier for rough segmentation of background pixels.

Main Results:

  • The developed filter effectively attenuated uneven background responses from SEM.
  • The new method caused less blurring compared to tried convolution-based techniques.
  • Background pixels in fibre images became more homogeneous after filtering.

Conclusions:

  • The proposed non-linear filter offers a fast and generalizable method for image background correction.
  • This technique significantly reduces artifacts caused by uneven illumination or detector response.
  • The method shows potential for various applications beyond fibre image analysis.