Topographical analysis of the onset VEP in the detection of paracentral visual field defects

Transient visual evoked potentials (VEP) were recorded simultaneously from 16 electrodes evenly placed over posterior scalp locations covering the occipital, posterior parietal and temporal areas. Interhemispheric amplitude difference of the N70 deflection was established across 6 homologous lateral electrode pairs in 15 normal controls and 32 patients with chiasmatic or retrochiasmatic cerebral lesions. Twenty-three of these had known homonymous or bitemporal field defects while 9 had normal fields on routine perimetry. Significant interhemispheric asymmetry of any single electrode pair occurred in 55% of the 32 patients with known pathology, while the cumulative yield of all electrode pairs was over 80 percent. The diagnostic yield of individual electrode pairs was significantly different: the electrode pair placed over the temporo-parietal junction detected the highest number of abnormalities. The cumulative abnormality taken over all lateral electrode pairs could be described with a curve well fitted with a probability summation function. It is inferred that the contribution of several independent generator sources is reflected in the N70 of the pattern onset VEP. The results suggest that multichannel recording of the interhemispheric amplitude distribution of the N70 of the onset VEP is useful for the evaluation of paracentral visual field defects.