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Updated: Sep 30, 2026
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The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
Published on: December 5, 2025
Guided-wave technique for the measurement of dielectric thin-film materials' thermal properties
Pascal Huguet-Chantĵme1, Ludovic Escoubas, François Flory
1Institut Fresnel, Unité Mixte de Recherche, Centre National de la Recherche Scientific 6133, Ecole National Supérieure de Physique de Marseille, Domaine Universitaire de Saint Jérĵme, France.
Applied Optics
|June 18, 2002
Abstract:
A pump-and-probe setup that uses a totally reflecting prism coupler is presented. Its electromagnetic and thermal models are described. To our knowledge, the first results are given concerning the measurement of thermal properties of thin films.
