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Sinusoidal-wavelength-scanning interferometer with double feedback control for real-time distance measurement
Osami Sasaki1, Kazuhiro Akiyama, Takamasa Suzuki
1Faculty of Engineering, Niigata University, Japan. osami@eng.niigata-u.ac.jp
Applied Optics
|July 9, 2002
Summary
This study introduces a novel wavelength-scanning interferometer. It uses a double feedback system to precisely measure absolute distances longer than a wavelength in real time.
Area of Science:
- Optics and Photonics
- Metrology and Measurement Science
Background:
- Interferometry is crucial for precise distance measurements.
- Conventional methods face limitations in real-time, absolute distance determination over long ranges.
Purpose of the Study:
- To develop a sinusoidal-wavelength-scanning interferometer capable of real-time absolute distance measurement.
- To implement a double feedback system for enhanced control and accuracy.
Main Methods:
- Utilizing a sinusoidal-wavelength-scanning interferometer with a phase-modulation amplitude (Zb).
- Employing a double feedback system to maintain phase (α) at 3π/2 and amplitude (Zb) at π.
- Developing voltage-controlled rulers for optical path difference and wavelength scan amplitude.
Main Results:
- The system achieves precise control of phase and amplitude through the feedback mechanism.
- The voltage outputs serve as precise rulers for sub-wavelength and wavelength-scale measurements.
- Demonstrated real-time measurement of absolute distances exceeding a wavelength.
Conclusions:
- The developed interferometer offers a robust solution for real-time absolute distance metrology.
- The dual feedback system and voltage-based rulers significantly enhance measurement accuracy and range.
- This technology has potential applications in precision engineering and scientific instrumentation.