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Field evaporation behaviour in the gamma phase in Ti-Al during analysis in the tomographic atom probe
W Lefebvre1, A Loiseau, A Menand
1Groupe de Physique des Materiaux, UMR CNRS 6634, Faculté des Sciences, Université de Rouen, Mont Saint Aignan, France. williams.lefebvre@univ-rouen.fr
Abstract:
A Ti-48 at% Al alloy has been successfully investigated, using atom probe field ion microscopy and transmission electron microscopy. After a specific heat treatment, this alloy has a (alpha2 + gamma) lamellar microstructure. Using the tomographic atom probe (TAP), it has been possible to image the stacking of superlattice planes of gamma and to identify titanium as the highest evaporation field element. In addition, the influence of analysis site on atom probe measurements has been estimated for this phase. A TAP analysis has also made it possible to observe an extremely thin step along a gamma/gamma interface at a near atomic scale.