S C Mayo1, P R Miller, S W Wilkins
1CSIRO, Manufacturing Science & Technology, PB33 Clayton Sth MDC, Vic 3169, Australia.
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We introduce a novel X-ray projection microscopy technique using a scanning electron microscope (SEM) that enhances image quality and information content. This method achieves sub-0.2 micrometer resolution and enables advanced imaging modes for diverse scientific applications.
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