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Surface displacement imaging by interferometry with a light emitting diode.

Stefan Dilhaire1, Stéphane Grauby, Sébastien Jorez

  • 1Centre de Physique Moléculaire Optique et Hertzienne-Université Bordeau 1, Talence, France.

Applied Optics
|September 6, 2002
PubMed
Summary

This study introduces a new imaging method using a Michelson interferometer to measure tiny surface movements in electronic components caused by temperature changes. The technique successfully captures surface displacement data for thermoelectric devices.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Electrical Engineering

Background:

  • Electronic components experience thermal expansion and contraction.
  • Measuring micro-scale surface displacements is crucial for device characterization.
  • Existing methods may be limited by speckle or resolution.

Purpose of the Study:

  • To develop and demonstrate an imaging technique for measuring static surface displacements of electronic components.
  • To utilize a Michelson interferometer for high-sensitivity displacement measurements.
  • To overcome speckle limitations using a light-emitting diode (LED) light source.

Main Methods:

  • A Michelson interferometer setup was employed.
  • A transient current was applied to the electronic component, inducing thermal variation and surface displacement.

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  • A light-emitting diode (LED) was used as the light source to mitigate speckle.
  • A visible CCD camera captured the optical interference patterns.
  • Image processing techniques were used to extract displacement amplitudes.

    • Main Results:

    • The technique successfully measured static surface displacements.
    • Out-of-plane surface-displacement images of a thermoelectric device were obtained.
    • The method demonstrated the ability to quantify thermally induced surface movements.

    Conclusions:

    • The presented imaging technique is effective for measuring static surface displacements in electronic components.
    • The use of an LED light source in a Michelson interferometer setup provides a viable solution to speckle issues.
    • This method offers a valuable tool for the analysis and characterization of electronic devices.