A method for the improvement of the visibility of transmission electron microscope images

A method is presented of improving the visibility of transmission electron microscope images in any situation in which a high resolution in only one chosen direction is of interest. The technique is based on the use of slot shaped objective apertures. Such apertures are of reduced area relative to a circular aperture giving the same all round resolution. The background intensity due to inelastically scattered electrons is thus reduced. The aperture device developed is described, while the value of the method is demonstrated by its application to the observation of dislocations. Further possible applications are indicated.