Michel Gauthier1, Ruben Pérez, Toyoko Arai
1Department of Physics, Graduate School of Science, University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-0033, Japan.
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Numerical simulations reveal that frequency modulation atomic force microscopy (FM-AFM) dynamics are conditionally stable. System resonance explains image shifts and extreme damping sensitivity to tip changes.
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