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Updated: Aug 11, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
Published on: February 27, 2015
Rupture of molecular thin films observed in atomic force microscopy. I. Theory
Hans-Jürgen Butt1, Volker Franz
1Max-Planck-Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany. butt@chemie.uni-siegen.de
Abstract:
In atomic force microscope studies of molecular thin films, a defined jump of the tip through the film is often observed once a certain threshold force has been exceeded. Here, we present a theory to describe this film rupture and to relate microscopic parameters to measurable quantities. We assume that the tip has to overcome an activation energy before the film ruptures. A universal relation between the force dependence of the activation energy and the approaching velocity of the tip is derived. Two complementary models for calculating the activation energy are presented: a continuum nucleation model and a discrete molecular model. Both models predict a narrow distribution of yield forces in agreement with experimental results.

