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High-resolution TOF-SIMS study of varying chain length self-assembled monolayer surfaces
Kurt V Wolf1, David A Cole, Steven L Bernasek
1Department of Chemistry, Princeton University, New Jersey 08544, USA.
Abstract:
A high-resolution time-of-flight secondary ionization mass spectrometer (TOF-SIMS) has been used to investigate chain length effects in hydrocarbon seff-assembled monolayer (SAM) surfaces on gold substrates. A wide range of n-alkanethiols was used to make homogeneous SAM surfaces, which included both odd and even hydrocarbon chain length thiols. Variations in coverage, extent of oxidation, and high-mass cluster formation as a function of hydrocarbon chain length of the alkanethiol SAM surfaces were investigated. Long-short chain length effects were observed for the relative coverage of the SAM surfaces, which directly influences the extent of oxidation for the thin films. The formation of gold-sulfur and gold-adsorbate cluster ions was also observed, since the mass range of the TOF-SIMS made it possible to monitor all of the cluster ions that were formed following the high-energy ion/surface interactions.