Analysis of the formed track in solid state materials using atomic force microscopy

The track formation in solid state materials, from the theoretical point of view, is still under study. One way to understand the track formation mechanisms and radiation damage of the charged particles in some materials such as polymers, glasses and minerals, is to analyse the surface topography effects. In this work, the track formation analysis in polycarbonate material is presented using an atomic force microscope (AFM) to characterise the evolution of the track on the material surface and beyond a thin layer of the surface material. The AFM is very useful to obtain valuable information at the level of the atomic structure of the materials and of the nuclear tracks, due to its high resolution and very easy operation involving also a simple sample preparation. The results show the development of the formed track by means of induced surface effects after being exposed to ionising radiation and chemical etching.