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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Point defects and the blue emission in fired quartz at high doses: a comparative luminescence and EPR study

C Woda1, T Schilles, U Rieser

  • 1Forschungsstelle Radiometrie der Heidelberger Akademie der Wissenschaften, Germany.

Radiation Protection Dosimetry
|October 18, 2002
PubMed

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