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TOF-SIMS and XPS-investigations of ion implanted single crystal 1b-diamonds

V Schlett1, T Fladung, S Dieckhoff

  • 1Fraunhofer-Institut IFAM, Wienerstr 12, 28359 Bremen. scht@ifam.fhg.de

Analytical and Bioanalytical Chemistry
|October 25, 2002
PubMed

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