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Updated: Sep 21, 2026

Fundamental Technical Elements of Freeze-fracture/Freeze-etch in Biological Electron Microscopy
Published on: September 11, 2014
A simple technique for examining frozen hydrated specimens in the scanning electron microscope
Abstract:
The use of a wide angle backscattered electron detector in a scanning electron microscope, which has the capability of the specimen chamber pressure being controlled independently of the column pressure, provides a simple technique for examining frozen hydrated specimens. Large specimens have been examined within 1 min of being placed on the stub and have been examined for many hours without charging artefacts or distortion due to dehydration.
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