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Related Experiment Videos

Methods for atom probe analysis of microgradients in functionally graded cemented carbides.

R Frykholm1, B Jansson, H-O Andrén

  • 1Department of Experimental Physics, Chalmers University of Technology and Göteborg University, SE-412 96 Göteborg, Sweden. robert@fy.chalmers.se

Micron (Oxford, England : 1993)
|December 12, 2002
PubMed
Summary

New methods prepare needle-shaped specimens for atom probe microscopy from near-surface regions. Focused ion beam milling overcomes challenges with difficult-to-electropolish materials, enabling precise analysis.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Surface Science

Background:

  • Atom probe microscopy requires high-quality, needle-shaped specimens.
  • Preparing specimens from near-surface regions, especially with compositional gradients or multiphase materials, presents significant challenges.
  • Preferential etching during electropolishing can hinder analysis of certain materials.

Purpose of the Study:

  • To develop and present robust methods for preparing needle-shaped specimens for atom probe microscopy from near-surface regions.
  • To demonstrate the applicability of the technique to gradient materials, specifically cemented carbides.
  • To highlight the advantages of focused ion beam (FIB) milling in specimen preparation.

Main Methods:

  • Specimen preparation involved dimple grinding, electropolishing, and focused ion beam (FIB) milling.

Related Experiment Videos

  • FIB milling was utilized to overcome preferential etching issues common with multiphase materials.
  • The technique allows for controlled depth selection and re-sharpening of specimens.

    • Main Results:

    • Successful preparation of needle-shaped specimens from a gradient-sintered WC-Ti(C,N)-TaC-Co cemented carbide.
    • Demonstration that FIB milling facilitates specimen preparation for materials difficult to electropolish.
    • Capability to prepare specimens at well-defined depths and select specific phases for analysis.

    Conclusions:

    • The developed specimen preparation technique, incorporating FIB milling, is effective for near-surface analysis using atom probe microscopy.
    • This method enhances the ability to analyze complex materials, including those with compositional gradients.
    • The technique offers improved control over specimen preparation, enabling precise microstructural and compositional investigations.