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Application of evanescent wave optics to the determination of absolute distance in surface force measurements using
S T Huntington1, P G Hartley, J Katsifolis
1Particulate Fluids Processing Centre, School of Chemistry, University of Melbourne, Parkville, Vic. 3010, Australia. shaneth@unimelb.edu.au
Ultramicroscopy
|January 14, 2003
Abstract:
A combined scanning near field optical/atomic force microscope (AFM) is used to obtain surface force measurements between a near field sensing tip and a tapered optical fibre surface, whilst simultaneously detecting the intensity of the evanescent field emanating from the fibre. The tapered optical fibre acts as a compliant sample to demonstrate the possible use of the near field intensity measurement system in determining 'real' surface separations from normal AFM surface force measurements at sub-nanometer resolution between deformable surfaces.