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Updated: Sep 27, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
10:22

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

Published on: June 16, 2014

A new approach to gas field ion sources

E Salançon1, Z Hammadi, R Morin

  • 1CRMC2-CNRS, Campus de Luminy-Case 913, Cedex 9 13288, Marseille, France. salacon@crmc2.univ-mrs.fr

Ultramicroscopy
|January 22, 2003
PubMed

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