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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Measurement of the excited-state lifetime of a microelectronic circuit

K W Lehnert1, K Bladh, L F Spietz

  • 1Department of Applied Physics and Physics, Yale University, New Haven, Connecticut 06511, USA. konrad.lehnert@yale.edu

Physical Review Letters
|February 7, 2003
PubMed

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