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Electron ionization cross sections for atomic subshells.

¹Department of Physics and Astronomy and Center for Solid State Science, Arizona State University, Tempe, AZ 85287-1504, USA. PETER.REZ@asu.edu

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

|February 25, 2003

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This study presents calculations of atomic shell ionization cross sections, crucial for analytical signals in X-ray microanalysis. Results highlight the impact of different approximations on K, L, and M shell ionization cross sections.

Area of Science:

Atomic Physics
X-ray Spectroscopy
Materials Analysis

Background:

Atomic ionization is fundamental to analytical techniques.
Accurate ionization cross sections are vital for quantifying analytical signals.

Purpose of the Study:

To calculate atomic shell ionization cross sections for elements used in X-ray microanalysis.
To evaluate the impact of various approximations on these cross sections across a range of electron energies.

Main Methods:

Utilized atomic wave functions for calculations.
Employed the Bethe ridge approximation for high energies.
Incorporated exchange corrections for low energies.

Main Results:

Presented ionization cross section calculations for K, L, and M shells.

Related Experiment Videos

Demonstrated the influence of different calculation approximations on results.

Covered electron energies up to 400 keV.

Conclusions:

The Bethe ridge approximation simplifies high-energy calculations.
Exchange corrections are important for low-energy accuracy.
Accurate cross sections are essential for reliable X-ray microanalysis.