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X-ray Crystal Spectrometers and Monochromators in Microanalysis.
David B. Wittry1, Nicholas C. Barbi
1Departments of Materials Science and Electrical Engineering, University of Southern California, University Park, Los Angeles, CA 90089-0241.
Summary
The development of X-ray wavelength spectrometers, crucial for electron probe microanalysis, has a rich history. This review covers key spectrometer designs and advancements from early experimental devices to modern innovations.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- Electron probe microanalysis (EPMA) relies heavily on X-ray wavelength spectrometers.
- Castaing's 1950 work on the electron probe microanalyzer spurred global instrument development.
- Spectrometer development was integral to the 'golden years' of microprobe advancement.
Purpose of the Study:
- To review the historical development of X-ray wavelength spectrometers for EPMA.
- To discuss the underlying physics of spectrometer and crystal design.
- To highlight key experimental and commercial spectrometer advancements.
Main Methods:
- Historical review of spectrometer evolution.
- Discussion of fundamental physics principles in spectrometer and crystal design.
- Analysis of early experimental and commercial spectrometer examples.
Main Results:
- Traces the evolution of spectrometers from early designs to present-day instruments.
- Details the physics of spectrometer and crystal design.
- Examines contributions from international scientists and commercial manufacturers.
- Highlights recent innovations like grazing-incidence optics and doubly curved crystals.
Conclusions:
- Spectrometer development has been a continuous international effort.
- Advancements in crystal optics and configurations have significantly improved microanalysis detection limits.
- Ongoing innovation in spectrometer design continues to enhance EPMA capabilities.