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Absorption and extinction correction in quantitative DAFS analysis.

Dirk C Meyer1, Andreas Kupsch, Peter Paufler

  • 1TU Dresden, Institut für Kristallographie und Festkörperphysik, D-01062 Dresden, Germany. dirk.meyer@physik.tu-dresden.de

Journal of Synchrotron Radiation
|February 28, 2003
PubMed
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This study introduces a new X-ray attenuation correction method for diffraction anomalous fine-structure (DAFS) measurements, improving accuracy by accounting for energy-dependent secondary extinction effects in materials like Co/Zr multilayers.

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Crystallography

Background:

  • Accurate X-ray diffraction data analysis requires effective correction for absorption and extinction effects.
  • Diffraction Anomalous Fine-Structure (DAFS) spectroscopy is sensitive to local atomic environments but can be complicated by secondary extinction.

Purpose of the Study:

  • To develop and validate an approach for X-ray attenuation correction in DAFS measurements.
  • To incorporate energy-dependent secondary extinction effects into a numerical diffraction model.
  • To apply the correction method to a Co/Zr multilayer system.

Main Methods:

  • A numerical model based on the kinematical theory of diffraction was developed.
  • The model accounts for energy-dependent secondary extinction effects.

Related Experiment Videos

  • DAFS measurements of Zr 0002 reflection intensities near the Zr K absorption edge were performed on a Co/Zr multilayer.

    • Main Results:

    • The presented approach successfully corrects for X-ray attenuation in DAFS measurements.
    • Energy-dependent secondary extinction effects were found to be significant and were successfully modeled.
    • X-ray absorption fine-structure (XAFS) measurements were essential for accurate DAFS amplitude correction.

    Conclusions:

    • The developed numerical model provides a robust method for X-ray attenuation correction in DAFS.
    • Accurate DAFS analysis necessitates considering secondary extinction effects.
    • The combination of DAFS and XAFS offers a powerful tool for materials characterization.