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Updated: Jul 30, 2026

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
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Published on: June 16, 2016

Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting

J W Bender1, M E Salmon, P E Russell

  • 1North Carolina State University, Analytical Instrumentation Facility, Raleigh, North Carolina, USA. benderjw@engr.sc.edu

Scanning
|March 12, 2003
PubMed

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