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Updated: Sep 26, 2026

Microfabrication of Implantable Optics Integrated in a Microstructured Imaging Window for Advanced In Vivo Imaging
Published on: April 11, 2025
Use of information on the manufacture of samples for the optical characterization of multilayers through a global
Jordi Sancho-Parramon1, Josep Ferré-Borrull, Salvador Bosch
1Department Física Aplicada i Optica, Universitat de Barcelona, Diagonal 647, 08028 Barcelona, Spain.
Abstract:
We present a procedure for the optical characterization of thin-film stacks from spectrophotometric data. The procedure overcomes the intrinsic limitations arising in the numerical determination of many parameters from reflectance or transmittance spectra measurements. The key point is to use all the information available from the manufacturing process in a single global optimization process. The method is illustrated by a case study of solgel applications.
