Use of information on the manufacture of samples for the optical characterization of multilayers through a global

Jordi Sancho-Parramon1, Josep Ferré-Borrull, Salvador Bosch

  • 1Department Física Aplicada i Optica, Universitat de Barcelona, Diagonal 647, 08028 Barcelona, Spain.

Applied Optics
|March 18, 2003
PubMed