Yosuke Tanaka1, Naoya Sako, Takashi Kurokawa
1Department of Electrical and Electronic Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei-shi, Tokyo 184-8588, Japan. tyosuke@cc.tuat.ac.jp
A new profilometry technique uses two-photon absorption in silicon avalanche photodiodes for precise measurements. This method achieves a broad dynamic range, spanning millimeters to tens of meters.
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