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Updated: Jul 30, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
In situ HREM study on the structural instability of isolated nanometre-sized alloy particles in the Sn-Bi system
1Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Yamadaoka 2-1, Suita, Osaka 565-0871, Japan.
Abstract:
The structural instability of isolated nm-sized alloy particles has been investigated by in situ transmission electron microscopy, using particles in the Sn-Bi system. In a pure tin (Sn) particle, no structural fluctuation was induced under electron-beam irradiation. In a tin-rich solid solution particle, an orientational fluctuation took place at a rate of approximately once per 1-3 s. In a high concentration alloy particle with a two-phase microstructure, a structural fluctuation occurred at a rate of a few hertz. Namely, the fluctuation became more frequent with increasing bismuth (Bi) concentration, no matter whether it consists of a single phase or multiple phases. A good parallelism can be found between this fluctuation enhancement with bismuth concentration and the fact that the free-energy difference between a solid particle and the corresponding liquid one decreases continuously with bismuth concentration and approaches a value close to zero at the eutectic composition. These results lead to a view that a nm-sized solid particle exhibits a structural instability under electron-beam irradiation when the free-energy difference between a solid particle and the corresponding liquid one is reduced to a value close to zero.

