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Updated: Aug 10, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Analysis of illumination coherence properties in small-source systems such as synchrotrons

Chang Chang1, Patrick Naulleau, David Attwood

  • 1Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA. cnchang@lbl.gov

Applied Optics
|May 17, 2003
PubMed
Summary

Modern synchrotron beamlines require a rigorous analysis of coherence, as standard approximations fail. This study reveals how beamline aberrations impact coherence properties, offering insights for improved experimental setups.

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