J A Hageman1, R Wehrens, R De Gelder
1Department of Analytical Chemistry, Universiteit van Nijmegen, Toernooiveld 1, NL-6525 ED Nijmegen, The Netherlands.
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This study introduces an improved powder X-ray diffraction indexing method using genetic algorithms and weighted cross-correlation. The new approach enhances accuracy in determining unit cell parameters for crystalline powders.
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