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Published on: March 20, 2015
Near-field Raman spectroscopy using a sharp metal tip
A Hartschuh1, N Anderson, L Novotny
1The Institute of Optics, University of Rochester, Wilmot Building, Rochester, NY 14627, USA. hartschu@optics.rochester.edu
Abstract:
Near-field Raman spectroscopy with a spatial resolution of 20 nm is demonstrated by raster scanning a sharp metal tip over the sample surface. The method is used to image vibrational modes of single-walled carbon nanotubes. By combining optical and topographical signals rendered by the single-walled carbon nanotubes, we can separate near-field and far-field contributions and quantify the observed Raman enhancement factors.
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