A versatile multipurpose scanning probe microscope

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Updated: Sep 25, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

E Cefalì1, S Patanè, P G Gucciardi

  • 1INFM, Università di Messina, Salita Sperone 31, I-98166 Messina, Italy.

Journal of Microscopy
|June 6, 2003
PubMed

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