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Related Experiment Videos

Transient optical elements: application to near-field microscopy.

D Simanovskii1, D Palanker, K Cohn

  • 1Picosecond Free Electron Laser Center, W.W. Hansen Experimental Physics Laboratory, Stanford University, Stanford, CA 94305-4085, USA. simanovski@stanford.edu

Journal of Microscopy
|June 6, 2003
PubMed
Summary
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We developed new near-field infrared microscopy techniques using transient probes. These methods enable faster scanning and imaging of delicate samples without mechanical scanning, advancing nanoscale optical analysis.

Area of Science:

  • Optics and Photonics
  • Materials Science
  • Nanotechnology

Background:

  • Near-field microscopy offers high spatial resolution.
  • Conventional methods often require mechanical scanning, limiting speed and sample compatibility.

Purpose of the Study:

  • To introduce novel transient probe techniques for near-field infrared microscopy.
  • To overcome limitations of mechanical scanning in near-field imaging.

Main Methods:

  • Developed a transient aperture (TA) using photoinduced reflectivity in semiconductors.
  • Created a transient solid immersion lens (SIL) on a semiconductor wafer via photoinduction.

Main Results:

  • Characterized optical properties of the transient mirror (TM) and TA.

Related Experiment Videos

  • Demonstrated near-field imaging capabilities using the TA.
  • Successfully formed a SIL for near-field probe applications.

    • Conclusions:

    • Transient probes eliminate mechanical scanning, enabling faster imaging rates.
    • These techniques are suitable for imaging soft and liquid samples.