Investigations into the use of a reverse scan in a quadrupole ion trap mass spectrometer

The forward scan (i.e. an increasing RF voltage ramp for the mass-selective instability scan) is commonly used as an analytical scan for ion detection with quadrupole ion trap instruments. A number of phenomena have been observed while using this scan technique. These include space charge effects resulting in the delayed ejection of ions from the ion trap, and the fragmentation of fragile ions producing very broad peaks. Here the use of a reverse scan (i.e. a decreasing RF voltage ramp) is examined to determine the effect of the above phenomena in this acquisition method. With regard to space charge effects, the apparent reduction of the carbon isotope spacing below one Thomson (for singly charged ions) that is observed with the forward scan is now replaced by an apparent increase in this spacing. The reverse scan, which optimizes at lower axial modulation ejection voltages than the forward scan, allows for the intact ejection of fragile ions under its typical operating conditions whereas the forward scan results in fragmentation. Reducing the axial modulation voltage for the ejection of ions in the forward scan results in less dissociation of the fragile ions during ion ejection, but with the observation of ghost peaks due to incomplete ejection of all of the ions at the resonance ejection condition. While performing the reverse scan experiment, the formation of product ions from dissociation of the MH(+) ion has also been observed.